Issue << content << Optimization of Thickness Measurement Technology of Rubber-Like Covering on a Diverse Substrate with Use of Eddy Current Testing


DOI:

2012. . No. 2(56) - Jun 2012, pp. 38-39

Optimization of Thickness Measurement Technology of Rubber-Like Covering on a Diverse Substrate with Use of Eddy Current Testing

O. N. Budadin, Yu. G. Kutyurin, O. V. Yukhatskova, E. E. Muhanov

It is shown that thickness of rubber-like covering on a heterogeneous conductive metal substrate can be measured with use of eddy current testing. The main problem is to provide maximum testing accuracy on the condition that thicknesses of rubber and metal substrate are constructively changed which results in necessity to repeatedly readjust the device. This problem is solved by optimal selection of surface clusters which have, on the one hand, a maximal area, and, on the other hand, provide a minimal error of measurement; a maximal error of measurement in this case is not more than 3%.
 
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NDT in Mining Industry

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NDT in Mining Industry

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