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DOI:

2012. . No. 3(57) - Sep 2012, pp. 38-42

X-Ray Spectral Analysis with Use of Silicon Detectors

A. S. Serebryakov

In this paper energy-dispersive analysis of X-ray spectra with the use of silicon detectors is under discussion. Comparison is made with the wave dispersive approach; three types of silicon detectors are briefly described including Si(Li) detectors, Si-pin detectors and SDD. Some attention is also given to the excitation systems for solving problems of X-ray fluorescent analysis.
 
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